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IXFB 100N50P
Symbol
Test Conditions
Characteristic Values
(T J = 25 ° C, unless otherwise specified)
Min. Typ. Max.
PLUS264 TM (IXFB) Outline
g fs
C iss
C oss
C rss
t d(on)
t r
t d(off)
t f
Q g(on)
Q gs
Q gd
V DS = 20 V; I D = 0.5 I D25 , Note 1
V GS = 0 V, V DS = 25 V, f = 1 MHz
V GS = 10 V, V DS = 0.5 V DSS , I D =0.5 I D25
R G = 1 ? (External)
V GS = 10 V, V DS = 0.5 V DSS , I D = 0.5 I D25
50
80
20
1700
140
36
29
110
26
240
96
78
S
nF
pF
pF
ns
ns
ns
ns
nC
nC
nC
R thJC
0.10 ° C/W
R thCS
0.13
° C/W
Source-Drain Diode
Characteristic Values
Symbol
Test Conditions
(T J = 25 ° C, unless otherwise specified)
Min. Typ. Max.
I S
I SM
V SD
t rr
Q RM
I RM
V GS = 0 V
Repetitive
I F = I S , V GS = 0 V, Note 1
I F = 25A, -di/dt = 100 A/ μ s
V R = 100V
0.6
6.0
100
250
1.5
200
A
A
V
ns
μ C
A
Notes:
1. Pulse test, t ≤ 300 μ s, duty cycle d ≤ 2 %
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETs and IGBTs are covered by 4,835,592
4,931,844
5,049,961
5,237,481
6,162,665
6,404,065 B1
6,683,344
6,727,585
one or moreof the following U.S. patents:
4,850,072
4,881,106
5,017,508
5,034,796
5,063,307
5,187,117
5,381,025
5,486,715
6,259,123 B1
6,306,728 B1
6,534,343
6,583,505
6,710,405B2
6,710,463
6,759,692
6,771,478 B2
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